Technologies. The solution to your sensing challenge: XperYenZ™ sensor systems. Paving the way for sensing applications that have never been possible before.

A novel way to 3D


XperYenZ™ sensor systems are based on innovative 3D sensing concepts and technologies. They determine distance from beam profile properties. Providing solutions beyond what other technologies like time-of-flight or structured light can offer. 

XperYenZ™ sensor systems determine distance from beam profile properties
XperYenZ™ sensor systems determine distance from beam profile properties

Various sensing materials


XperYenZ™ works with different sensors and sensor-materials. Linear sensors, such as Si photodiodes or CMOS, can be used for the analysis of beam profile properties especially for scanning and imaging applications.

Examples for the implementation with a non-linear sensor are our 3D trackers using photodetectors like thin film photovoltaic technologies or lead sulfide photoconductors: FIP sensors.


Visible and infrared measurements


XperYenZ™ systems work with wavelengths from visible to infrared. XperYenZ™ sensor systems can deduct depth from direct and reflected light. Thus, you can use it for applications where the measurement target actively emits light or where light is projected onto the target.


Novel technology


Based on proprietary technology, XperYenZ™ can be your solution to enter markets which are currently out of reach due to competitors' patents.

Tune your own XperYenZ™


3D sensing is a balance of multiple parameters like range, resolution, speed and cost. Our XperYenZ™ technology portfolio allows us to tune these parameters to fulfill your requirements while keeping the system as lean as possible.

We can tune the sensing parameters to what’s most important to your application.